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Journal of Applied Physics

Volumn 67, Issue 3, 1990, Pages 1461-1470

Ion-induced electrical breakdown in metal-oxide-silicon capacitors

(1) Milgram, Alvin A a

a Advanced Research & Applications Corporation (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038716826 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.345652 Document Type: Article

Times cited : (11)

References (23)

1
- 84896095032
- (1987) IEEE Trans. Nucl. Sci. , vol.NS‐34 , pp. 1262
- Wrobel, T.F.¹

2
- 49449127443
- (1977) Nucl. Track Detection , vol.1 , pp. 71
- Klein, N.¹ Solomon, P.² Tommasino, L.³

3
- 0019634092
- (1981) Nucl. Instrum. Methods , vol.189 , pp. 569
- Klein, N.¹

4
- 33645892600
- (1978) Nucl. Instrum. Methods , vol.154 , pp. 471
- Smirnov, A.N.¹ Eismont, V.P.²

5
- 84950544923
- 169; D. Miller, R. Griffith, and K. Vindelov, Lawrence Livermore National Laboratory Report No. VCRL‐86035 (1981). II th Congress IRPA
- (1980) Neutron Detection with Real‐Time Response by Compact Thin‐Film MOS Arrays
- Griffith, R.¹ Fisher, J.² Tommasino, L.³ Zapparoli, G.⁴

6
- 0016409643
- (1976) J. Vac. Sci. Technol. , vol.13 , pp. 50
- DiStefano, T.H.¹ Shatzkes, M.²

7
- 0007590290
- (1988) J. Appl. Phys. , vol.63 , pp. 970
- Klein, N.¹

8
- 0020174458
- (1982) J. Appl. Phys. , vol.53 , pp. 5828
- Klein, N.¹

9
- 84941504025
- (1985) IEEE Trans. Electron Devices , vol.ED 32 , pp. 413
- Chen, I.¹ Holland, S.E.² Hu, C.³

10
- 0022768904
- (1986) J. Electrochem. Soc. , vol.133 , pp. 1705
- Holland, S.¹ Hu, C.²

11
- 0000653194
- (1987) J. Appl. Phys. , vol.61 , pp. 1947
- Weinberg, Z.A.¹ Nguyen, T.N.²

12
- 0038210345
- (1987) J. Vac. Sci. Technol. , vol.5 , pp. 1563
- Wolters, D.R.¹ Zegers‐van Duijnhoven, A.T.A.²

13
- 7044274046
- (1987) J. Appl. Phys. , vol.61 , pp. 1592
- Chen, D.N.¹ Cheng, Y.C.²

14
- 0041525322
- (1987) Appl. Phys. Lett. , vol.50 , pp. 104
- Liang, M.S.¹ Choi, J.Y.²

15
- 0016496969
- (1975) J. Appl. Phys. , vol.46 , pp. 1484
- Tommasino, L.¹ Klein, N.² Solomon, P.³

16
- 36549090991
- (1988) J. Appl. Phys. , vol.64 , pp. 743
- Avni, E.¹ Shappir, J.²

17
- 3743093560
- (1986) IEEE Electron Device Lett. , vol.EDL‐7 , pp. 506
- Lee, J.¹ Chen, I.² Hu, C.³

18
- 0022689456
- (1986) IEEE Electron Device Lett. , vol.EDL‐7 , pp. 164
- Chen, I.C.¹ Holland, S.E.² Hu, C.³

19
- 2442708060
- (1987) Appl. Phys. Lett. , vol.50 , pp. 1200
- Fishbein, B.J.¹ Plummer, J.D.²

20
- 36549094818
- (1988) J. Appl. Phys. , vol.63 , pp. 5887
- Fishbein, B.J.¹ Plummer, J.D.²

21
- 84950544924
- (private communication).
- Franco, E.¹

22
- 0021977853
- (1985) Philips J. Res. Rep. , vol.40 , pp. 164
- Wolters, D.R.¹ Van der Schoot, J.J.²

23
- 0019701394
- (1981) IEEE Trans. Nucl. Sci. , vol.28 , pp. 3975
- Oldham, T.R.¹ McGarrity, J.M.²

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