Observations of single event failure in power MOSFETS

Volumn , Issue , 1994, Pages 41-54

  Nichols, Donald K ^a   McCarty, Kenneth P ^a   Coss, James R ^a   Waskiewicz, Al ^a   Groninger, Jerry ^a   Oberg, Dennis ^a   Wert, Jerry ^a   Majewski, Peter ^a   Koga, Rocky ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CRYSTAL DEFECTS; DATA STRUCTURES; FAILURE ANALYSIS; IONS; POWER ELECTRONICS; SEMICONDUCTOR DEVICE MANUFACTURE; VOLTAGE CONTROL;

EXTRAPOLATION; FAILURE THRESHOLDS; GATE RUPTURE; GATE SOURCE VOLTAGE; SINGLE EVENT FAILURE;

MOSFET DEVICES;

EID: 0028697338     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)