Charge generation by heavy ions in power mosfets, burnout space predictions, and dynamic SEB sensitivity

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1704-1711

  Stassinopoulos, E G ^a   Brucker, G J ^b   Calvel, P ^c   Baiget, A ^c   Peyrotte, C ^c   Gaillard, R ^d  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b West Long Branch ^*  (United States)

^c THALES ALENIA SPACE   (France)

^d Nuclétudes   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939736673     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211357     Document Type: Article

References (19)

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