First nondestructive measurements of power mosfet single event burnout cross sections

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1736-1741

  Oberg, Dennis L ^a   Wert, Jerry L ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957221316     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337546     Document Type: Article

References (8)

1. G. J. Brucker, P. R. Measel, D. L. Oberg, J. L. Wert, & T. L. Criswell, “SEU Sensitivity of Power Converters with MOSFETs in Space”, presented at the IEEE Conference on Nuclear and Space Radiation Effects, Snowmass, Co., July 27–31, 1987.
2. A. E. Waskiewicz, J. W. Groninger, V. H. Strahan, & D. M. Long, “Burnout of Power MOS Transistors with Heavy Ions of Californium-252”, IEEE Trans. Nuc. Sci., NS-33, 1710–1713, Dec 1986.
3. A. E. Waskiewicz, J. W. Groninger, W. A. Kolasinski, J. W. Adolphson, & J. L. Titus, “Measurement of Heavy-Ion-Induced Burnout Thresholds and Burnout Cross Sections of Power MOS Transistors”, presented at the IEEE Conference on Nuclear and Space Radiation Effects, Snowmass, Co., July 27–31, 1987.
4. “HEXFET Databook”, El Segundo, CA, International Rectifier, 1985, A-164.
5. A. K. Richter & I. Arimura, “Laser Simulation of Single-Event Burnout in Power MOSFETs”, presented at the IEEE Conference on Nuclear and Space Radiation Effects, Snowmass, Co., July 27–31, 31, 1987.
6. T. L. Criswell, D. L. Oberg, J. L. Wert, P. R. Measel, & W. E. Wilson, “Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles”, presented at the IEEE Conference on Nuclear and Space Radiation Effects, Snowmass, Co., July 27–31, 1987.
7. T. L. Criswell, P. R. Measel, & K. L. Whalin, “Single Event Upset Testing With Relativistic Heavy Ions,” IEEE Trans. Nuc. Sci., NS-31, 1559–1561, 1561, Dec 1984.
8. W. A. Kolasinski, R. Koga, “Hleavy Ion-Induced Single Event Upsets of Microcircuits; a Summary of the Aerospace Corporation Test Data”, IEEE Trans. Nuc. Sci., NS-31, 1190–1195, Dec 1984.