Radiation-induced effects on special super large N-channel power MOSFETS for space applications

First European Conference on Radiation and Its Effects on Devices and Systems - RADECS 91

Volumn , Issue , 1992, Pages 128-132

  Joseph, Haskel M ^a  

^a Rockwell International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZING RADIATION; MOSFET DEVICES; RELIABILITY; SPACECRAFT;

SINGLE EVENT UPSETS;

RADIATION EFFECTS;

EID: 0026973202     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)