A Superconducting Nanowire Single-Photon Detector (SnSPD) system for ultra low voltage Time-Resolved Emission (TRE) measurements of VLSI circuits

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2013, Pages 182-188

  Stellari, Franco ^a   Weger, Alan J ^a   Kim, Seongwon ^a   Maliuk, Dzmitry ^a   Song, Peilin ^a   Ainspan, Herschel A ^a   Kwark, Young ^a   Baks, Christian W ^a   Kindereit, Ulrike ^a   Anant, Vikas ^b   Lundquist, Ted ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Photon Spot Inc   (United States)

^c DCG SYSTEMS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; NANOWIRES; SUPERCONDUCTIVITY; VLSI CIRCUITS;

INTEGRATED CIRCUITS (ICS); ITS APPLICATIONS; PICOSECOND IMAGING CIRCUIT ANALYSIS; SINGLE-PHOTON DETECTORS; SUPERCONDUCTING NANOWIRE; SUPERCONDUCTING NANOWIRE SINGLE PHOTON DETECTORS; TIME-RESOLVED EMISSIONS; ULTRA-LOW-VOLTAGE;

PARTICLE BEAMS;

EID: 84903977486     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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