Near-infrared photon emission spectroscopy trends in scaled SOI technologies

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2012, Pages 128-134

  Kindereit, Ulrike ^a   Weger, Alan J ^a   Stellari, Franco ^a   Song, Peilin ^a   Deslandes, Hervé ^b   Lundquist, Ted ^b   Sabbineni, Prasad ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b DCG SYSTEMS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; FAILURE ANALYSIS; PHOTONS;

BROAD SPECTRAL; COOLED CAMERA; CUTOFF WAVELENGTHS; NEAR-INFRARED PHOTONS; PROCESS TECHNOLOGIES; RING OSCILLATOR; SOI TECHNOLOGY;

INFRARED DEVICES;

EID: 84874289593     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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4. Faggion, Gael, et al., "Effect of IC Geometry Shrink on Photon Emission Spectrum", LSI Testing Symposium Japan, 2007.
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8. Song, Peilin, et al., "Timing analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD)", Int. Symp. for Testing and Failure Analysis, 2004, pp. 197-202.