Near-infrared photon emission spectroscopy of a 45 nm SOI ring oscillator

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2012, Pages

  Kindereit, Ulrike ^a   Weger, Alan J ^a   Stellari, Franco ^a   Song, Peilin ^a   Deslandes, Hervé ^b   Lundquist, Ted ^b   Sabbineni, Prasad ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b DCG SYSTEMS INC   (United States)

Author keywords

failure analysis; HgCdTe; MCT; PEM; Photon emission microscopy; red shift; SOI; spectroscopy

Indexed keywords

HGCDTE; MCT; PEM; PHOTON EMISSION MICROSCOPY; RED SHIFT; SOI;

BANDPASS FILTERS; EMISSION SPECTROSCOPY; FAILURE ANALYSIS; INFRARED DEVICES; MERCURY COMPOUNDS; SPECTROSCOPY;

PHOTONS;

EID: 84866601291     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2012.6241783     Document Type: Conference Paper

References (9)

1. S. Rusu, S. Seidel, G. Woods, D. Grannes, H. Muljono, J. Rowlette and K. Petrosky, "Backside Infrared Probing for Static Voltage Drop and Dynamic Timing Measurements", Proc. ISSCC, Session 17, 2001.
2. th Annual International Reliability Physics Symposium (IRPS), San Jose, 2006, pp. 595-601.
3. J.C. Tsang and J. A. Kash, "Picosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits", pp. 889-891, Appl. Phys. Lett. 70 (7), 1997.
4. G. Faggion, P. Sardin, S. Dudit, M. Vallet, H. Deslandes, J.-P. Roux, H. Koike and T. Kuki, "Effect of IC Geometry Shrink on Photon Emission Spectrum", LSI Testing Symposium Japan, 2007.
5. th International Symposium for Testing and Failure Analysis (ISTFA), 2011, pp. 164-169.
6. th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.1-5, 2008.
7. P. Song et al., "Timing analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD)", Int. Symp. for Testing and Failure Analysis, 2004, pp. 197-202.
8. th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.315-319, 2006.
9. Stanislav Polonsky and Keith A. Jenkins, "Time-resolved measurements of self-heating in SOI and strained-silicon MOSFETs using photon emission microscopy", IEEE Electron Dev. Let., vol 25, no. 4, 2004, pp. 208-210.