On-chip power supply noise measurement using time resolved emission (TRE) waveforms of light emission from off-state leakage current (LEOSLC)

Proceedings - International Test Conference

Volumn , Issue , 2009, Pages

  Stellari, Franco ^a   Song, Peilin ^a   Sylvestri, John ^b   Miles, Darrell ^b   Forlenza, Orazio ^b   Forlenza, Donato ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP POWER; CMOS GATE; LOCAL PROBES; OFF-STATE LEAKAGE CURRENT; ON CHIPS; SILICON ON INSULATOR; TIME-RESOLVED EMISSIONS; WAVE FORMS;

LIGHT EMISSION;

MICROPROCESSOR CHIPS;

EID: 76549110577     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2009.5355543     Document Type: Conference Paper

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