MARVEL Malicious alteration recognition and verification by emission of light

2011 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2011

Volumn , Issue , 2011, Pages 117-121

  Song, Peilin ^a   Stellari, Franco ^a   Pfeiffer, Dirk ^a   Culp, Jim ^b   Weger, Al ^a   Bonnoit, Alyssa ^b   Wisnieff, Bob ^a   Taubenblatt, Marc ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE DEVICES; CHIP UNDER TESTS; DATA INTERPRETATION; ELECTRIC STIMULI; ELECTRICAL TESTS; HIGH SENSITIVITY; IMAGING PROCESSING; INFRARED LIGHT; PHOTON DETECTOR; SPATIAL RESOLUTION; STATIC AND DYNAMIC;

DATA HANDLING; ELECTRIC INSULATION TESTING; PHOTONS;

LIGHT EMISSION;

EID: 80051983059     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HST.2011.5955007     Document Type: Conference Paper

References (4)

1. High Performance Microchip Supply, http://www.acq.osd.mil/dsb/reports/ ADA435563.pdf
2. X. Wang, M. Tehranipoor, and J. Plusquellic, "Detecting malicious inclusions in secure hardware: challenges and solutions," in Proc. IEEE International Workshop on Hardware-Oriented Sesurity and Trust (HOST'08), pp. 15-19, 2008
3. Dakshi Agrawal, Selcuk Baktir, Deniz Karakoyunlu, Pankaj Rohatgi, and Berk Sunar, "Trojan detection using ic fingerprinting,"in Security and Privacy, 2007. SP '07. IEEE Symposium on, 2007, pp. 296-310. (Pubitemid 47432536)
4. S. M. Mansfield and G. S. Kino, Appl. Phys. Lett., 1990, vol. 57, pp. 2615.