메뉴 건너뛰기




Volumn 7, Issue 1, 2013, Pages 45-59

Passivation techniques for InAs/GaSb strained layer superlattice detectors

Author keywords

InAs GaSb; Infrared detection; Passivation; Strained layer superlattice

Indexed keywords

AUGER RECOMBINATION PROCESS; BANDGAP MATERIALS; DIELECTRIC PASSIVATION; HIGH QUANTUM EFFICIENCY; INAS; INAS/GASB; INFRARED DETECTION; INFRARED SPECTRUM; INTERBAND TUNNELING; MATERIAL PROPERTY; ORGANIC MATERIALS; RESPONSIVITY; SENSING MATERIAL; SINGLE PIXEL; STRAINED LAYER SUPERLATTICE; SURFACE EFFECT; SURFACE LEAKAGE CURRENTS;

EID: 84872950620     PISSN: 18638880     EISSN: 18638899     Source Type: Journal    
DOI: 10.1002/lpor.201100029     Document Type: Review
Times cited : (52)

References (96)
  • 27
    • 1642387683 scopus 로고    scopus 로고
    • A. Rogalski ; Opt. Eng. 42(12), 3498 (2003).
    • (2003) Opt. Eng. , vol.42 , Issue.12 , pp. 3498
    • Rogalski, A.1
  • 48
    • 84872962348 scopus 로고    scopus 로고
    • Proceedings of the 6th EMRS DTC Technical Conference, Edinburgh
    • S. dip Das, S. L. Tan, S. Zhang, Y. L. Goh, C. H. Ting, and J. David, in: Proceedings of the 6th EMRS DTC Technical Conference, Edinburgh 2009, p. B7.
    • (2009)
    • Dip Das, S.1    Tan, S.2    Zhang, S.3    Goh, Y.4    Ting, C.5    David, J.6
  • 50
    • 84872899358 scopus 로고    scopus 로고
    • E. R. Weber, in: Advances in Infrared Photodetectors, edited by S. Gunapala, D. Rhiger, and C. Jagadish, Semiconductors and Semimetals Vol. 84 (Elsevier, San Diego, CA, USA, 2010)
    • E. R. Weber, in: Advances in Infrared Photodetectors, edited by S. Gunapala, D. Rhiger, and C. Jagadish, Semiconductors and Semimetals Vol. 84 (Elsevier, San Diego, CA, USA, 2010), p. 38.
  • 63
    • 84872982094 scopus 로고    scopus 로고
    • US Patent No. 4882245, 1989.
    • US Patent No. 4882245, 1989.
  • 81
  • 87
    • 84872959770 scopus 로고    scopus 로고
    • Nist X-ray photoelectron spectroscopy database, version 3.5, (2003), date of last visit: 17 January 2012.
    • Nist X-ray photoelectron spectroscopy database, version 3.5, http://srdata.nist.gov/xps/ (2003), date of last visit: 17 January 2012.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.