Strains, planes, and EBSD in materials science

Materials Today

Volumn 15, Issue 9, 2012, Pages 366-376

  Wilkinson, Angus J ^a   Britton, T Ben ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

3-D MICROSCOPY; CRYSTALLOGRAPHIC TEXTURES; DATA SETS; ELECTRON BACK SCATTER DIFFRACTION; MATERIALS CHARACTERIZATION; NEW APPLICATIONS; STRAIN MAPPING;

MICROSTRUCTURE; STRAIN;

CHARACTERIZATION;

EID: 84867342661     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(12)70163-3     Document Type: Review

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