Three-dimensional orientation mapping in the transmission electron microscope

Science

Volumn 332, Issue 6031, 2011, Pages 833-834

  Liu, H H ^a   Schmidt, S ^a   Poulsen, H F ^a   Godfrey, A ^b   Liu, Z Q ^c   Sharon, J A ^d   Huang, X ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b TSINGHUA UNIVERSITY   (China)

^c INSTITUTE OF METAL RESEARCH   (China)

^d Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; NANOCRYSTAL;

ALUMINUM; ELECTRON MICROSCOPY; EXPERIMENTAL STUDY; MAPPING METHOD; NUMERICAL MODEL; RESOLUTION; SPATIAL ANALYSIS; THREE-DIMENSIONAL MODELING; X-RAY DIFFRACTION;

ALGORITHM; ARTICLE; COMPUTER PROGRAM; CRYSTALLOGRAPHY; ELECTRON BEAM; ERROR; GRAIN; IMAGE RECONSTRUCTION; OPTICAL RESOLUTION; PRIORITY JOURNAL; SIMULATION; SURFACE PROPERTY; THICKNESS; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79955998859     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1202202     Document Type: Article

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