Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction

Journal of Microscopy

Volumn 239, Issue 1, 2010, Pages 32-45

  Winkelmann, A ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

convergent beam electron diffraction; dynamical electron diffraction; Electron backscatter diffraction; Kikuchi pattern

Indexed keywords

BACKSCATTERING; DIFFRACTION PATTERNS; ELECTRON SCATTERING; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFEROMETRY; MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY;

BACKSCATTERED ELECTRONS; CONVERGENT BEAM ELECTRON DIFFRACTION; CONVERGENT BEAMS; DEPTH DEPENDENTS; DEPTH-RESOLVED; DYNAMICAL ELECTRON DIFFRACTION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; KIKUCHI PATTERNS; SCANNING ELECTRONS;

ELECTRON DIFFRACTION;

ARTICLE; COMPARATIVE STUDY; CONCEPTUAL FRAMEWORK; CONTROLLED STUDY; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; MATHEMATICAL COMPUTING; MONTE CARLO METHOD; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPE; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77953828855     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03353.x     Document Type: Article

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