Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 758-759

  Maurice, Claire ^a   Fortunier, Roland ^a   Driver, Julian ^a   Day, Austin ^b   Mingard, Ken ^c   Meaden, Graham ^d  

^a Ecole Nationale Superieure des Mines   (France)

^b Claremont House   (United Kingdom)

^c NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^d BLG Productions   (United Kingdom)

Author keywords

Calibration; EBSD; Scanning electron microscope; Strain

Indexed keywords

ANISOTROPY; CALIBRATION; CRYSTAL STRUCTURE; ELASTICITY; ELECTRON BACKSCATTER DIFFRACTION ANALYSIS; ELECTRON DIFFRACTION; GEOMETRY; NOTE; SIMULATION; STRESS STRAIN RELATIONSHIP;

EID: 77949356809     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.02.003     Document Type: Note

References (10)

1. Kacher J., Landon C., Adams B.L., Fullwood D. Bragg's Law diffraction simulations for electron backscatter diffraction analysis. Ultramicroscopy 2009, 109:1148-1156.
2. Troost K.Z., Van der Sluis P., Gravesteijn D.J. Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning electron microscope. Applied Physics Letters 1993, 62:1110-1112.
3. Wilkinson A.J., Meaden G., Dingley D.J. High resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicroscopy 2006, 106:307-313.
4. S. Villert, Analyse des déformations élastiques locales par la technique EBSD, PhD thesis, Ecole des Mines de Saint Etienne (2008).
5. A.P. Day, Developments in the EBSP technique and its application to grain imaging, PhD thesis, University of Bristol (1993).
6. Villert S., Maurice C., Wyon C., Fortunier R. Accuracy assessment of elastic strain measurement by EBSD. Journal of Microscopy 2009, 233(Pt 2):290-301.
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8. Winkelmann A., Trager-Cowan C., Sweeney F., Day A.P., Parbrook P. Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 2007, 107:414-421.
9. Day A.P. Spherical EBSD. Journal of Microscopy 2008, 230(pt 3):472-486.
10. Winkelmann A. Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction. Ultramicroscopy 2008, 108:1546-1550.