Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction

Philosophical Magazine

Volumn 90, Issue 9, 2010, Pages 1159-1177

  Wilkinson, Angus J ^a   Randman, David ^a,b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Dislocation mechanics; Dislocations; EBSD; Electron diffraction; Electron microscopy; Mechanics of materials; Nanoindentation

Indexed keywords

CROSS CORRELATIONS; DISLOCATION MECHANICS; DISLOCATIONS; EBSD PATTERN; ELASTIC STRAIN; ELASTIC STRAIN FIELDS; ELECTRON BACK SCATTER DIFFRACTION; FREE SURFACES; GEOMETRICALLY NECESSARY DISLOCATIONS; HIGH RESOLUTION; HIGHER NOISE LEVELS; HOOP STRAIN; LATTICE ROTATIONS; LOWER BOUNDS; MECHANICS OF MATERIALS; NANOINDENTS; OPTIMISATION METHOD; OPTIMISATIONS; RADIAL STRAINS; STEP SIZE; STRAIN FIELDS; SUB-REGIONS; TWO-DIMENSIONAL MAP;

BACKSCATTERING; CRYSTAL LATTICES; ELECTRON DIFFRACTION; ELECTRONS; NANOINDENTATION; NEMATIC LIQUID CRYSTALS; ROTATION; SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SINGLE CRYSTALS; STRAIN; TWO DIMENSIONAL;

MECHANICS;

EID: 77951193548     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430903304145     Document Type: Article

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