On solving the orientation gradient dependency of high angular resolution EBSD

Ultramicroscopy

Volumn 113, Issue , 2012, Pages 171-181

  Maurice, Claire ^a   Driver, Julian H ^a   Fortunier, Roland ^b  

^a LCG   (France)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

Cross correlation; Electron backscatter diffraction; Orientation gradients; Plastic deformation; Scanning electron microscopy; Strain

Indexed keywords

CROSS CORRELATIONS; DEFORMED METALS; DYNAMIC THEORY; ELASTIC STRAIN; ELECTRON BACKSCATTER DIFFRACTION; FINITE STRAIN; HIGH ANGULAR RESOLUTIONS; MICROSTRAINS; ORIENTATION GRADIENTS; REFERENCE PATTERNS; RESIDUAL ERROR; SCANNING ELECTRONS; TWO-STEP PROCEDURE;

ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; NEMATIC LIQUID CRYSTALS; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; STRAIN;

ROTATION;

METAL;

ALGORITHM; ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; CONTROLLED STUDY; ELASTICITY; ELECTRON DIFFRACTION; HIGH ANGULAR RESOLUTION ELECTRON BACKSCATTER DIFFRACTION; SIMULATION;

EID: 84856958486     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.10.013     Document Type: Article

References (29)

1. Troost K.Z., Vandersluis P., Gravesteijn D.J. Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning electron-microscope. Applied Physics Letters 1993, 62:1110-1112.
2. Wilkinson A. Measurement of elastic strains and small lattice rotations using electron backscatter diffraction. Ultramicroscopy 1996, 62:237-247.
3. Wilkinson A., Dingley D., Meaden G. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicroscopy 2006, 106:307-313.
4. Bate P.S., Knutsen R.D., Brough I., Humphreys F.J. The characterization of low-angle boundaries by EBSD. Journal of Microscopy 2005, 220:36-46.
5. Villert S., Maurice C., Wyon X., Fortunier R. Accuracy assessment of elastic strain measurement by EBSD. Journal of Microscopy 2009, 233:290-301.
6. S. Villert, Analyse des déformations élastiques locales par la technique EBSD, Ph.D. Thesis, Ecole des Mines de Saint Etienne, 2008.
7. Vaudin M.D., Gerbig Y.B., Stranick S.J., Cook R.F. Comparison of nanoscale measurements of strain and stress using electron back scattered diffraction and confocal Raman microscopy. Applied Physics Letters 2008, 93:193116.
8. Vaudin M.D., Stan G., Gerbig Y.B., Cook R.F. High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM. Ultramicroscopy 2011, 111:1206-1213.
9. Miyamoto G., Shibata A., Maki T., Furuhara T. Precise measurement of strain accommodation in austenite matrix surrounding martensite in ferrous alloys by electron backscatter diffraction analysis. Acta Materialia 2009, 57:1120-1131.
10. Wilkinson A.J., Randman D. Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction. Philosophical Magazine 2010, 90:1159-1177.
11. Britton T.B., Liang H., Dunne F.P.E., Wilkinson A.J. The effect of crystal orientation on the indentation response of commercially pure titanium: experiments and simulations. Proceedings of the Royal Society a-Mathematical Physical and Engineering Sciences 2010, 466:695-719.
12. Britton T.B., Birosca S., Preuss M., Wilkinson A.J. Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti-6Al-4V alloy. Scripta Materialia 2010, 62:639-642.
13. Karamched P.S., Wilkinson A.J. High resolution electron back scatter diffraction analysis of thermally and mechanically induced strains near carbide inclusions in a superalloy. Acta Materialia 2011, 59:263-272.
14. Ojima M., Adachi Y., Suzuki S., Tomota Y. Stress partitioning behavior in an fcc alloy evaluated by the in situ/ex situ EBSD-Wilkinson method. Acta Materialia 2011, 59:4177-4185.
15. Gardner C.J., Adams B.L., Basinger J., Fullwood D.T. EBSD-based continuum dislocation microscopy. International Journal of Plasticity 2010, 26:1234-1247.
16. Wright S.I., Nowell M., Field D.P. A review of strain analysis using electron backscatter diffraction. Microscopy and Microanalysis 2011, 17:1-14.
17. Britton T.B., Wilkinson A.J. Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction. Ultramicroscopy 2011, 111:1395-1404.
18. Kuhlmann-Wilsdorf D. The theory of dislocation-based crystal plasticity. Philosophical Magazine A 1999, 79:955-1008.
19. Mughrabi H., Ungar T., Kienle W., Wilkens M. Long-range internal stresses and asymmetric X-ray line-broadening in tensile-deformed [001]-orientated copper single crystals. Philosophical Magazine A 1986, 53:793-813.
20. Spence J.C.H., Zuo J.M. Electron Microdiffraction 1992, Plenum Press, New York, London.
21. Winkelmann A., Trager-Cowan C., Sweeney F., Day A.P., Parbrook P. Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 2007, 107:414-421.
22. Maurice C., Dzieciol K., Fortunier R. A method for accurate localisation of EBSD pattern centres. Ultramicroscopy 2011, 111:140-148.
23. Kacher J., Landon C., Adams B.L., Fullwood D. Bragg's Law diffraction simulations for electron backscatter diffraction analysis. Ultramicroscopy 2009, 109:1148-1156.
24. Mingard K., Day A.P., Maurice C., Quested P. Towards high accuracy calibration of EBSD systems. Ultramicroscopy 2011, 111:320-329.
25. Maurice C., Fortunier R., Driver J.H., Day A., Mingard K., Meaden G. Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood. Ultramicroscopy 2010, 110:758-759.
26. Britton T.B., Maurice C., Fortunier R., Driver J.H., Day A.P., Meaden G., Dingley D.J., Mingard K., Wilkinson A.J. Factors affecting the accuracy of High resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy 2010, 110:1443-1453.
27. Day A.P. Spherical EBSD. Journal of Microscopy 2008, 230:472-486.
28. Winkelmann A. Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction. Ultramicroscopy 2008, 108:1546-1550.
29. Chevalier L., Calloch S., Hild F., Marco Y. Digital image correlation used to analyse the multiaxial behavior of rubber-like materials. European Journal of Mechanics A/Solids 2001, 20:169-187.