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Volumn 59, Issue 16, 2011, Pages 6489-6500

Geometrically necessary dislocation density distributions in Ti-6Al-4V deformed in tension

Author keywords

Cross correlation; Deformation; EBSD; GND; Strain

Indexed keywords

BACKGROUND LEVEL; CROSS CORRELATIONS; EBSD; ELECTRON BACK SCATTER DIFFRACTION; GEOMETRICALLY NECESSARY DISLOCATIONS; GND; LATTICE ROTATIONS; POLYCRYSTALLINE SAMPLES; SMALL AREA; STEP SIZE; TENSILE DEFORMATION; TI-6AL-4V;

EID: 80051800640     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.07.016     Document Type: Article
Times cited : (124)

References (46)
  • 20
    • 0000877946 scopus 로고    scopus 로고
    • Mapping residual plastic strain in materials using electron backscatter diffraction
    • A.J. Schwartz, Dordrecht Kluwer Academic, Plenum Publishers
    • E.M. Lehockey, Y. Lin, and O.E. Lepik Mapping residual plastic strain in materials using electron backscatter diffraction A.J. Schwartz, Electron backscatter diffraction in materials science 2000 Dordrecht Kluwer Academic, Plenum Publishers 247
    • (2000) Electron Backscatter Diffraction in Materials Science , pp. 247
    • Lehockey, E.M.1    Lin, Y.2    Lepik, O.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.