High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations

Ultramicroscopy

Volumn 114, Issue , 2012, Pages 82-95

  Britton, T B ^a   Wilkinson, A J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Deformation; EBSD; Electron backscatter diffraction; Kinematics; SEM; Strain

Indexed keywords

CROSS CORRELATIONS; CROSS-CORRELATION ANALYSIS; DYNAMICAL DIFFRACTION THEORY; EBSD; ELASTIC STRAIN; ELASTIC STRAIN TENSOR; ELECTRON BACKSCATTER DIFFRACTION; FINITE DEFORMATIONS; FINITE ROTATIONS; FUNDAMENTAL EQUATIONS; HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTIONS; INFINITESIMAL DEFORMATION THEORY; KINEMATIC ANALYSIS; LARGE ROTATION; LATTICE ROTATIONS; MIS-ORIENTATION; NUMERICAL EXPERIMENTS; PATTERN SHIFTS; REFERENCE PATTERNS; REMAPPING; REMAPPING ALGORITHMS; ROTATION MATRICES; TEST PATTERN; TRACTION-FREE BOUNDARY CONDITIONS;

CRYSTAL LATTICES; DEFORMATION; ELECTRON DIFFRACTION; KINEMATICS; RECOVERY; SCANNING ELECTRON MICROSCOPY; STRAIN;

NEMATIC LIQUID CRYSTALS;

ACCURACY; ALGORITHM; ARTICLE; DIFFRACTION; ELASTIC STRAIN VARIATION; ELECTRON BACKSCATTER DIFFRACTION; FINITE DEFORMATION KINEMATIC ANALYSIS; IMAGE QUALITY; LATTICE ROTATION; PHYSICAL PHENOMENA; ROTATION; STATISTICAL ANALYSIS;

EID: 84857211764     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.01.004     Document Type: Article

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