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Volumn 60, Issue 9, 2009, Pages 913-922

Electron backscatter diffraction: Strategies for reliable data acquisition and processing

Author keywords

Electron backscatter diffraction; Microtexture; Orientation

Indexed keywords

BEST PRACTICE; CHARACTERISATION; ELECTRON BACKSCATTER DIFFRACTION; EXPERIMENT DESIGN; GRAIN SIZE; MICROSTRUCTURE CHARACTERISATION; MICROTEXTURE; ORIENTATION;

EID: 67650001618     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2009.05.011     Document Type: Short Survey
Times cited : (109)

References (42)
  • 1
    • 41849150440 scopus 로고    scopus 로고
    • Microtexture evolution via deformation twinning and slip during compression of magnesium alloy AZ31
    • Jiang J., Godfrey A., Liu W., and Liu Q. Microtexture evolution via deformation twinning and slip during compression of magnesium alloy AZ31. Mater Sci Eng (2008) 483-484:576-579
    • (2008) Mater Sci Eng
    • Jiang, J.1    Godfrey, A.2    Liu, W.3    Liu, Q.4
  • 2
    • 33748087838 scopus 로고    scopus 로고
    • Characterization of the microstructure and texture of nanostructured electrodeposited NiCo using electron backscatter diffraction (EBSD)
    • Bastos A., Zaefferer S., Raabe D., and Schuh C. Characterization of the microstructure and texture of nanostructured electrodeposited NiCo using electron backscatter diffraction (EBSD). Acta Mater 54 (2006) 2451-2462
    • (2006) Acta Mater , vol.54 , pp. 2451-2462
    • Bastos, A.1    Zaefferer, S.2    Raabe, D.3    Schuh, C.4
  • 3
    • 43449103335 scopus 로고    scopus 로고
    • Five-parameter grain boundary distribution of commercially grain boundary engineered nickel and copper
    • Randle V., Rohrer G., Miller H., Coleman M., and Owen G. Five-parameter grain boundary distribution of commercially grain boundary engineered nickel and copper. Acta Mater 56 (2008) 2363-2373
    • (2008) Acta Mater , vol.56 , pp. 2363-2373
    • Randle, V.1    Rohrer, G.2    Miller, H.3    Coleman, M.4    Owen, G.5
  • 4
    • 33947288646 scopus 로고    scopus 로고
    • Application of electron backscatter diffraction to the study of phase transformations
    • Gourgues-Lorenzon A.F. Application of electron backscatter diffraction to the study of phase transformations. Int Mater Rev 57 (2007) 65-128
    • (2007) Int Mater Rev , vol.57 , pp. 65-128
    • Gourgues-Lorenzon, A.F.1
  • 5
    • 33747196660 scopus 로고    scopus 로고
    • Identification of phases in zinc alloy powders using electron backscatter diffraction
    • Perez M., Kenik E., O Keefe M., Miller F., and Johnson B. Identification of phases in zinc alloy powders using electron backscatter diffraction. Mater Sci Eng 424A (2006) 239-250
    • (2006) Mater Sci Eng , vol.424 A , pp. 239-250
    • Perez, M.1    Kenik, E.2    O Keefe, M.3    Miller, F.4    Johnson, B.5
  • 6
    • 33344475405 scopus 로고    scopus 로고
    • High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity
    • Wilkinson A., Meaden G., and Dingley D. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicros 106 (2006) 307-313
    • (2006) Ultramicros , vol.106 , pp. 307-313
    • Wilkinson, A.1    Meaden, G.2    Dingley, D.3
  • 8
    • 0003594630 scopus 로고    scopus 로고
    • Schwartz A.J., Kumar M., and Adams B.L. (Eds), Kluwer Academic, New York
    • In: Schwartz A.J., Kumar M., and Adams B.L. (Eds). Electron backscatter diffraction in materials science (2000), Kluwer Academic, New York
    • (2000) Electron backscatter diffraction in materials science
  • 9
    • 84879462007 scopus 로고    scopus 로고
    • Schwartz AJ, Kumar M, Adams BL, Field DP Editors, Second Edition, Springer, New York, in press
    • Schwartz AJ, Kumar M, Adams BL, Field DP (Editors). Electron backscatter diffraction in materials science, Second Edition, Springer, New York, in press.
    • Electron backscatter diffraction in materials science
  • 10
    • 40449085961 scopus 로고    scopus 로고
    • Recent developments in electron backscatter diffraction
    • Randle V. Recent developments in electron backscatter diffraction. Adv Imaging Electron Phys 151 (2008) 363-416
    • (2008) Adv Imaging Electron Phys , vol.151 , pp. 363-416
    • Randle, V.1
  • 12
    • 67649904663 scopus 로고    scopus 로고
    • Present state of electron backscatter diffraction and prospective developments
    • Second Edition. Schwartz AJ, Kumar M, Adams BL, Field DP Editors, Springer, New York, in press
    • Schwarzer R, Field D, Adams B, Kumar M, Schwartz A. Present state of electron backscatter diffraction and prospective developments. In Electron backscatter diffraction in materials science, Second Edition. Schwartz AJ, Kumar M, Adams BL, Field DP (Editors), Springer, New York, in press.
    • Electron backscatter diffraction in materials science
    • Schwarzer, R.1    Field, D.2    Adams, B.3    Kumar, M.4    Schwartz, A.5
  • 13
    • 0017493689 scopus 로고
    • Accurate microcrystallography using electron back-scattering patterns
    • Venables J., and Bin-Jaya R. Accurate microcrystallography using electron back-scattering patterns. Phil Mag 35A (1977) 1317-1332
    • (1977) Phil Mag , vol.35 A , pp. 1317-1332
    • Venables, J.1    Bin-Jaya, R.2
  • 14
    • 1542349278 scopus 로고    scopus 로고
    • Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy
    • Dingley D.J. Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy. J Micros 213 (2004) 214-224
    • (2004) J Micros , vol.213 , pp. 214-224
    • Dingley, D.J.1
  • 15
    • 0028736985 scopus 로고
    • Advances in backscattered-electron Kikuchi patterns for crystallographic phase identification
    • Bailey G., and Garratt-Reed A. (Eds), San Francisco Press Inc.
    • Michael J., and Goehner R. Advances in backscattered-electron Kikuchi patterns for crystallographic phase identification. In: Bailey G., and Garratt-Reed A. (Eds). Proc. 52nd annual meeting of the Microscopy Society of America (1994), San Francisco Press Inc. 596-597
    • (1994) Proc. 52nd annual meeting of the Microscopy Society of America , pp. 596-597
    • Michael, J.1    Goehner, R.2
  • 16
    • 0015627883 scopus 로고
    • Electron backscattering pattern - a new technique for obtaining crystallographic information in the scanning electron microscope
    • Venables J., and Harland C. Electron backscattering pattern - a new technique for obtaining crystallographic information in the scanning electron microscope. Phil Mag 27 (1973) 1193
    • (1973) Phil Mag , vol.27 , pp. 1193
    • Venables, J.1    Harland, C.2
  • 17
    • 0008923220 scopus 로고    scopus 로고
    • Schwartz A.J., Kumar M., and Adams B.L. (Eds), Kluwer Academic press, New York
    • Dingley D. In: Schwartz A.J., Kumar M., and Adams B.L. (Eds). Electron backscatter diffraction in materials science (2000), Kluwer Academic press, New York 1
    • (2000) Electron backscatter diffraction in materials science , pp. 1
    • Dingley, D.1
  • 18
    • 0035880592 scopus 로고    scopus 로고
    • Review - grain and subgrain characterization by electron backscatter diffraction
    • Humphreys F.J. Review - grain and subgrain characterization by electron backscatter diffraction. J Mater Sci 36 (2001) 3833
    • (2001) J Mater Sci , vol.36 , pp. 3833
    • Humphreys, F.J.1
  • 19
    • 0037211014 scopus 로고    scopus 로고
    • Viewpoint: experimental recovery of geometrically necessary dislocation density in polycrystals
    • El-Dasher B., Adams B., and Rollett A. Viewpoint: experimental recovery of geometrically necessary dislocation density in polycrystals. Scripta Mater 48 (2003) 141
    • (2003) Scripta Mater , vol.48 , pp. 141
    • El-Dasher, B.1    Adams, B.2    Rollett, A.3
  • 21
    • 67649960769 scopus 로고    scopus 로고
    • Strain mapping using electron backscatter diffraction
    • Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP, Schwartz, in press
    • Wilkinson A, Dingley D,Meadon G. Strain mapping using electron backscatter diffraction. In Electron backscatter diffraction in materials science, Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP, Schwartz., in press.
    • Electron backscatter diffraction in materials science
    • Wilkinson, A.1    Dingley, D.2    Meadon, G.3
  • 22
    • 67649957395 scopus 로고    scopus 로고
    • Application of electron backscatter diffraction to phase identification
    • Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP. Springer, New York, in press
    • El-Dasher B, Deal A. Application of electron backscatter diffraction to phase identification. In Electron backscatter diffraction in materials science, Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP. Springer, New York, in press.
    • Electron backscatter diffraction in materials science
    • El-Dasher, B.1    Deal, A.2
  • 23
    • 67649938580 scopus 로고    scopus 로고
    • Wright S, Nowell M. A comparison of texture measurements via EBSD and XRay. ICOTOM15, ed. A.D. Rollett, American Ceramic Soc. and TMS (on CD). ISBN 978-1-57498-296-1.
    • Wright S, Nowell M. A comparison of texture measurements via EBSD and XRay. ICOTOM15, ed. A.D. Rollett, American Ceramic Soc. and TMS (on CD). ISBN 978-1-57498-296-1.
  • 24
    • 44249098788 scopus 로고    scopus 로고
    • A fast ACOM/EBSD system Arch
    • Schwarzer R. A fast ACOM/EBSD system Arch. Metall Mater 53 (2008) 5
    • (2008) Metall Mater , vol.53 , pp. 5
    • Schwarzer, R.1
  • 25
    • 67649951716 scopus 로고    scopus 로고
    • A review of in situ EBSD studies
    • Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP. Springer, New York in press
    • Wright S, Nowell M. A review of in situ EBSD studies. In Electron backscatter diffraction in materials science, Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP. Springer, New York in press.
    • Electron backscatter diffraction in materials science
    • Wright, S.1    Nowell, M.2
  • 27
    • 51749112879 scopus 로고    scopus 로고
    • Carbide precipitation and grain boundary plane selection in overaged type 316 austenitic stainless steel
    • Jones R., Owen G., and Randle V. Carbide precipitation and grain boundary plane selection in overaged type 316 austenitic stainless steel. Mater Sci Eng A496 (2008) 256-261
    • (2008) Mater Sci Eng , vol.A496 , pp. 256-261
    • Jones, R.1    Owen, G.2    Randle, V.3
  • 30
    • 33846134707 scopus 로고    scopus 로고
    • Microstructure and texture of a lightly deformed TRIP-assisted steel characterized by means of the EBSD technique
    • Petrov R., Kestens L., Wasilkowska A., and Houbaert Y. Microstructure and texture of a lightly deformed TRIP-assisted steel characterized by means of the EBSD technique. Mater Sci Eng A447 (2007) 285
    • (2007) Mater Sci Eng , vol.A447 , pp. 285
    • Petrov, R.1    Kestens, L.2    Wasilkowska, A.3    Houbaert, Y.4
  • 31
    • 41349110847 scopus 로고    scopus 로고
    • Automatic determination of recrystallization parameters based on EBSD mapping
    • Wu G., and Juul Jensen D. Automatic determination of recrystallization parameters based on EBSD mapping. Maters Char 59 (2008) 794-800
    • (2008) Maters Char , vol.59 , pp. 794-800
    • Wu, G.1    Juul Jensen, D.2
  • 33
    • 3242666351 scopus 로고    scopus 로고
    • Twinning-related grain boundary engineering (overview)
    • Randle V. Twinning-related grain boundary engineering (overview). Acta Mater 52 (2004) 4067-4081
    • (2004) Acta Mater , vol.52 , pp. 4067-4081
    • Randle, V.1
  • 34
    • 0036915243 scopus 로고    scopus 로고
    • Sigma-boundary statistics by length and number
    • Randle V. Sigma-boundary statistics by length and number. Interface Sci 10 (2002) 271-277
    • (2002) Interface Sci , vol.10 , pp. 271-277
    • Randle, V.1
  • 35
    • 16244385335 scopus 로고    scopus 로고
    • Universal features of grains boundary networks in FCC materials
    • Schuh C., Kumar M., and King W. Universal features of grains boundary networks in FCC materials. J Mater Sci 40 (2005) 847-852
    • (2005) J Mater Sci , vol.40 , pp. 847-852
    • Schuh, C.1    Kumar, M.2    King, W.3
  • 36
    • 44649176375 scopus 로고    scopus 로고
    • CSL grain boundary distribution in alumina and zirconia ceramics
    • Vonlanthen P., and Grobety B. CSL grain boundary distribution in alumina and zirconia ceramics. Ceram Int 34 (2008) 1459-1472
    • (2008) Ceram Int , vol.34 , pp. 1459-1472
    • Vonlanthen, P.1    Grobety, B.2
  • 37
    • 54349109513 scopus 로고    scopus 로고
    • Grain boundary fracture in CuAlNi shape memory alloys
    • Creuzigera A., and Croneb W. Grain boundary fracture in CuAlNi shape memory alloys. Mater Sci Eng A498 (2008) 404-411
    • (2008) Mater Sci Eng , vol.A498 , pp. 404-411
    • Creuzigera, A.1    Croneb, W.2
  • 38
    • 3242889204 scopus 로고    scopus 로고
    • Measuring the five-parameter grain-boundary distribution from observations of planar sections
    • Saylor D., El-Dasher B., Adams B., and Rohrer G. Measuring the five-parameter grain-boundary distribution from observations of planar sections. Met Mat Trans 35A (2004) 1981-1989
    • (2004) Met Mat Trans , vol.35 A , pp. 1981-1989
    • Saylor, D.1    El-Dasher, B.2    Adams, B.3    Rohrer, G.4
  • 39
    • 67649954218 scopus 로고    scopus 로고
    • Measurement of the five-parameter grain boundary distribution from planar sections
    • Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP. Springer, New York, in press
    • Rohrer G, Randle V. Measurement of the five-parameter grain boundary distribution from planar sections. In Electron backscatter diffraction in materials science, Second Edition, Editors Schwartz AJ, Kumar M, Adams BL, Field DP. Springer, New York, in press.
    • Electron backscatter diffraction in materials science
    • Rohrer, G.1    Randle, V.2
  • 40
    • 67349240863 scopus 로고    scopus 로고
    • Grain boundary plane populations in minerals; the example of wet NaCl after low strain deformation
    • Pennock G., Coleman M., Drury M., and Randle V. Grain boundary plane populations in minerals; the example of wet NaCl after low strain deformation. Contrib Mineral Petrol 158 (2009) 53-67
    • (2009) Contrib Mineral Petrol , vol.158 , pp. 53-67
    • Pennock, G.1    Coleman, M.2    Drury, M.3    Randle, V.4
  • 41
    • 33751369541 scopus 로고    scopus 로고
    • Grain boundary populations in wet and dry NaCl
    • Pennock G., Drury M., and Spiers C. Grain boundary populations in wet and dry NaCl. Mat Sci Tech 22 (2006) 1307
    • (2006) Mat Sci Tech , vol.22 , pp. 1307
    • Pennock, G.1    Drury, M.2    Spiers, C.3
  • 42
    • 58149461801 scopus 로고    scopus 로고
    • The application of focused ion beam microscopy in the materials sciences
    • Munroe P.R. The application of focused ion beam microscopy in the materials sciences. Maters Char 60 (2009) 2-13
    • (2009) Maters Char , vol.60 , pp. 2-13
    • Munroe, P.R.1


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