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Volumn 11, Issue 4, 2005, Pages 341-353

Measurement and mapping of small changes of crystal orientation by electron backscattering diffraction

Author keywords

Cross correlation; EBSD; Hough transform; Orientation mapping; Phase correlation

Indexed keywords


EID: 23844465706     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927605050270     Document Type: Article
Times cited : (20)

References (11)
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  • 2
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  • 3
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  • 4
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  • 6
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  • 7
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    • Tao, X.1    Eades, A.2
  • 8
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    • Microscale elastic strain determination by backscatter Kikuchi diffraction in the scanning electron microscope
    • TROOST, K.Z., VAN DER SLUIS, P. & GRAVESTEIJN, D.J. (1993). Microscale elastic strain determination by backscatter Kikuchi diffraction in the scanning electron microscope. Appl Phys Lett 62, 1110-1112.
    • (1993) Appl Phys Lett , vol.62 , pp. 1110-1112
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  • 9
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    • Measurement of elastic strains and small lattice rotation using electron back scatter diffraction
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  • 10
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    • Wilkinson, A.J.1
  • 11
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    • Recursive implementation of the Gaussian filter
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.