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Volumn 106, Issue 8, 2011, Pages

Site-specific recoil diffraction of backscattered electrons in crystals

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ANGULAR DISTRIBUTION; BACKSCATTERING; ELECTRON SCATTERING; SAPPHIRE; SCANNING ELECTRON MICROSCOPY;

EID: 79952092249     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.106.085503     Document Type: Article
Times cited : (29)

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