Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1395-1404

  Britton, T B ^a   Wilkinson, A J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Copper; Deformation; EBSD; Electron backscatter diffraction; Scanning electron microscope; Strain

Indexed keywords

CROSS CORRELATIONS; EBSD; ELASTIC STRAIN; ELECTRON BACK-SCATTER PATTERNS; ELECTRON BACKSCATTER DIFFRACTION; GEOMETRICALLY NECESSARY DISLOCATIONS; HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTIONS; IMAGE SHIFTS; ITERATIVE FITTING; LARGE SHIFTS; LATTICE ROTATIONS; LEAST SQUARE ERRORS; SCANNING ELECTRON MICROSCOPE; TOTAL STRAIN;

BACKSCATTERING; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; ELECTRONS; SCANNING ELECTRON MICROSCOPY; STRAIN;

ROTATION;

COPPER; TITANIUM;

ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; DIGITAL IMAGING; ELASTICITY; ELECTRON BACKSCATTER DIFFRACTION; IMAGE ANALYSIS; IMAGE QUALITY; MATHEMATICAL MODEL; OPTICAL RESOLUTION; PARTIAL LEAST SQUARES REGRESSION; PROCESS MODEL; RELIABILITY; STRESS STRAIN RELATIONSHIP; STRUCTURE ANALYSIS; SURFACE PROPERTY; VALIDATION PROCESS;

EID: 80051821342     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.05.007     Document Type: Article

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