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Journal of Materials Science

Volumn 36, Issue 16, 2001, Pages 3833-3854

Grain and subgrain characterisation by electron backscatter diffraction

(1) Humphreys, F J a

a UNIVERSITY OF MANCHESTER (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; IMAGING SYSTEMS; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BACKSCATTER DIFFRACTION (EBSD);

GRAIN SIZE AND SHAPE;

EID: 0035880592 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1017973432592 Document Type: Review

Times cited : (981)

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