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Volumn 36, Issue 16, 2001, Pages 3833-3854

Grain and subgrain characterisation by electron backscatter diffraction

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; IMAGING SYSTEMS; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035880592     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1017973432592     Document Type: Review
Times cited : (960)

References (84)
  • 20
    • 0003721265 scopus 로고    scopus 로고
    • VMAP is a suite of programmes developed for quantitative analysis of the EBSD data generated by the HKL Channel acquisition system. It can be made available on request
    • (2000)
    • Humphreys, F.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.