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Volumn 56, Issue 23, 1997, Pages 15391-15395
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Charge dynamics and time evolution of contact potential studied by atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000654387
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.56.15391 Document Type: Article |
Times cited : (44)
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References (8)
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