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Volumn 56, Issue 23, 1997, Pages 15391-15395

Charge dynamics and time evolution of contact potential studied by atomic force microscopy

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EID: 0000654387     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.15391     Document Type: Article
Times cited : (44)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.