Carbon nanotube tips for atomic force microscopy

Nature Nanotechnology

Volumn 4, Issue 8, 2009, Pages 483-491

  Wilson, Neil R ^a   MacPherson, Julie V ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; CHARACTERIZATION (MATERIALS SCIENCE); YARN;

AFM TIP; CARBON NANOTUBE TIP; IMAGING TOOLS; LATERAL RESOLUTION; RADIUS OF CURVATURE; STRUCTURAL CHARACTERIZATION; SURFACE SCIENCE;

ATOMIC FORCE MICROSCOPY;

CARBON NANOTUBE; DOUBLE WALLED NANOTUBE; SINGLE WALLED NANOTUBE;

ATOMIC FORCE MICROSCOPY; BIOSENSOR; CATALYST; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPE; IMAGE QUALITY; PRIORITY JOURNAL; REVIEW; SURFACE PROPERTY; THERMAL CONDUCTIVITY;

EID: 68949192795     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2009.154     Document Type: Review

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