Carbon Nanotube Scanning Probe for Imaging in Aqueous Environment

IEEE Transactions on Nanobioscience

Volumn 3, Issue 1, 2004, Pages 56-60

  Stevens, Ramsey M ^a   Nguyen, Cattien V ^a   Meyyappan, M ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

Atomic force microscopy (afm); Bionanotechnology; Carbon nanotubes (cnts); Nanotechnology; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; DNA; HYDROPHOBICITY; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; NANOTECHNOLOGY; SCANNING; SOLUTIONS;

BIONANOTECHNOLOGY; CHEMICAL INCOMPATIBILITY; CNT; SCANNING PROBE MICROSCOPY;

PROBES;

MICA;

CARBON NANOTUBE; ETHYLENEDIAMINE; ETHYLENEDIAMINE DERIVATIVE; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; METHODOLOGY; SOLUBILITY;

ETHYLENEDIAMINES; MICROSCOPY, ATOMIC FORCE; NANOTUBES, CARBON; SOLUBILITY; WATER;

EID: 2342557986     PISSN: 15361241     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNB.2004.824275     Document Type: Article

References (9)

1. H. Dai, "Nanotubes as nanoprobes in scanning probe microscopy," Nature, vol. 384, pp. 147-150, 1996.
2. J. H. Hafner, "Growth of nanotubes for probe microscopy tips," Nature, vol. 398, pp. 761-762, 1994.
3. C. L. Cheung, "Carbon nanotube atomic force microscopy tips: Direct growth by chemical vapor deposition and application to high-resolution imaging," Proc. Nat. Acad. Sci., vol. 97, pp. 3809-3813, 2000.
4. H. Nishijima, "Carbon-nanotube tips for scanning probe microscopy: Preparation by a controlled process and observation of deoxyribonucleic acid," Appl. Phys. Lett., vol. 74, pp. 4061-4063, 1999.
5. R. Stevens, "Improved fabrication approach for carbon nanotube probe devices," Appl. Phys. Lett., vol. 77, pp. 3453-3455, 2000.
6. C. V. Nguyen, "Carbon nanotube tip probes: Stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors," Nanotechnology, vol. 12, pp. 363-367, 2001.
7. _, "Carbon nanotube scanning probe for profiling of deep-ultraviolet and 193 nm photoresist patterns," Appl. Phys. Lett., vol. 81, pp. 901-903, 2002.
8. Q. Hudspeth, "How does a multiwalled carbon nanotube atomic force microscopy probe affect the determination of surface roughness statistics?," Surf. Sci., vol. 515, pp. 453-461, 2002.
9. J. Kong, "Nanotube molecular wires as chemical sensors," Science, vol. 287, pp. 622-625, 2000.