Influence of elastic deformation on single-wall carbon nanotube atomic force microscopy probe resolution

Journal of Physical Chemistry B

Volumn 108, Issue 36, 2004, Pages 13613-13618

  Shapiro, Ian R ^a   Solares, Santiago D ^b,c   Esplandiu, Maria J ^a,e   Wade, Lawrence A ^d   Goddard, William A ^a,c   Collier, C Patrick ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b California Institute of Technology   (United States)

^c Mat and Process Simulation Centre   (United States)

^d California Institute of Technology   (United States)

^e UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON PROBES; SINGLE-WALL CARBON NANOTUBES (SWNT); THERMAL VIBRATIONS; TOPOGRAPHIC IMAGING;

ALGORITHMS; ASPECT RATIO; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; EQUATIONS OF MOTION; FREQUENCIES; MOLECULAR DYNAMICS; OSCILLATIONS; POTENTIAL ENERGY; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES;

EID: 4544255135     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp047937x     Document Type: Article

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