Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

Applied Physics Letters

Volumn 80, Issue 11, 2002, Pages 1996-1998

  Larsen, T ^a   Moloni, K ^a   Flack, F ^b   Eriksson, M A ^b   Lagally, M G ^b   Black, C T ^c  

^a PIEZOMAX Technologies Inc   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE PROBES; WEAR CHARACTERISTICS; WEAR PROPERTIES;

ATOMIC FORCE MICROSCOPY; CARBON; CARBON NANOTUBES;

PROBES;

EID: 79957967645     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1452782     Document Type: Article

References (10)

1. S. Iijima, Nature (London) 354, 147 (1991). nat NATUAS 0028-0836
2. H. Dai, J. H. Hafner, A. G. Rinzler, D. T. Colbert, and R. E. Smalley, Nature (London) 384, 147 (1996). nat NATUAS 0028-0836
3. G. Binning, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986). prl PRLTAO 0031-9007
4. P. Eames and K. Moloni (unpublished).
5. S. B. Arnason, A. G. Rinzler, Q. Hudspeth, and A. F. Hebard, Appl. Phys. Lett. 75, 2842 (1999). apl APPLAB 0003-6951
6. K. Moloni, M. Buss, and R. Andres, Ultramicroscopy 80, 237 (1999). ult ULTRD6 0304-3991
7. U.S. Patent Appl. Serial No. 09/621,710, Katerina Moloni, July 24, 2000.
8. K. Moloni, A. Lal, and M. G. Lagally, Proc. SPIE 4098, 76 (2000). spi PSISDG 0277-786X
9. C. Teichert, J. Tersoff, M. G. Lagally, in Morphological Organization in Epitaxial Growth and Removal, edited by Z. Zhang and M. G. Lagally (World Scientific, Singapore, 1999).
10. O. Lourie, D. M. Cox, and H. D. Wagner, Phys. Rev. Lett. 81, 1638 (1998). prl PRLTAO 0031-9007