Developments in nanowire Scanning Electrochemical - Atomic Force Microscopy (SECM-AFM) probes

Proceedings of IEEE Sensors

Volumn , Issue , 2007, Pages 712-715

  Burt, D P ^a   Dobson, P S ^a   Weaver, J M R ^a   Wilson, N R ^b   Unwin, P R ^b   Macpherson, J V ^b  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; ELECTRIC WIRE; ELECTROLYSIS; NANOWIRES; PROBES; SENSORS; SINGLE-WALLED CARBON NANOTUBES (SWCN); THICKNESS MEASUREMENT;

ACTIVE SITES; DISC ELECTRODES; ELECTRIC FORCES; ELECTROCHEMICAL MEASUREMENTS; FABRICATION METHODS; IMAGING APPLICATIONS; MICROMETER SCALES; MICRON SCALES; PROBE APICES; PROBE GEOMETRIES; SINGLE-WALLED CARBON NANOTUBE BUNDLES; STRUCTURAL TEMPLATES; TOPOGRAPHIC INFORMATIONS;

ATOMIC FORCE MICROSCOPY;

EID: 48349134386     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2007.4388499     Document Type: Conference Paper

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