Atomic force microscopy using single-wall C nanotube probes

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 3, 2002, Pages 822-827

  Snow, E S ^a   Campbell, P M ^a   Novak, J P ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; PROBES; STABILITY; SURFACE PHENOMENA;

ATOMIC FORCE MICROSCOPY (AFM) PROBES;

CARBON NANOTUBES;

EID: 0035998540     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1469017     Document Type: Conference Paper

References (26)