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Volumn 73, Issue 23, 1998, Pages 3465-3467

Single-walled carbon nanotube probes for high-resolution nanostructure imaging

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000870782     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122798     Document Type: Article
Times cited : (164)

References (23)
  • 16
    • 22244436035 scopus 로고    scopus 로고
    • AFM images were recorded at a resonant frequency of 50-80 kHz with amplitudes of 15-75 nm, while scanning at a rate of 0.25-1.75 Hz. The nanotubes were attached to FESP cantilevers (k=1-5N/m, Digital Instruments, Santa Barbara, CA)
    • AFM images were recorded at a resonant frequency of 50-80 kHz with amplitudes of 15-75 nm, while scanning at a rate of 0.25-1.75 Hz. The nanotubes were attached to FESP cantilevers (k=1-5N/m, Digital Instruments, Santa Barbara, CA).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.