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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 1, 2000, Pages 104-106

Carbon-nanotube probe equipped magnetic force microscope

(4) Arie, Takayuki a Nishijima, Hidehiro a Akita, Seiji a Nakayama, Yoshikazu a

a Osaka Prefecture University (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENZENE; CARBIDES; CARBON; DECOMPOSITION; ELECTRON DIFFRACTION; MAGNETIZATION; NICKEL; NICKEL COMPOUNDS; PROBES; SILICON SENSORS;

MAGNETIC FORCE MICROSCOPY; NICKEL CARBIDE;

NANOTUBES;

EID: 0033711846 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.591159 Document Type: Article

Times cited : (69)

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