Nano-oxidation and in situ faradaic current detection using dynamic carbon nanotube probes

Nanotechnology

Volumn 15, Issue 9, 2004, Pages 1126-1130

  Kuramochi, H ^a,b   Ando, K ^a,b   Shikakura, Y ^a,b   Yasutake, M ^a,b   Tokizaki, T ^a   Yokoyama, H ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b SII NANOTECHNOLOGY INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; ELECTRIC CURRENT MEASUREMENT; FARADAY EFFECT; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; PASSIVATION; PROBES;

FARADAIC CURRENT DETECTION; IONIC CURRENTS; NANO-OXIDATION; SCANNING PROBE MICROSCOPES (SPM);

CARBON NANOTUBES;

EID: 4544229132     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/9/004     Document Type: Article

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