Amplitude response of multiwalled carbon nanotube probe with controlled length during tapping mode atomic force microscopy

Journal of Physical Chemistry C

Volumn 112, Issue 40, 2008, Pages 15631-15636

  Jiang, A N ^a   Gao, S ^a   Wei, X L ^a   Liang, X L ^a   Chen, Q ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CARBON; MICROSCOPES; MICROSCOPIC EXAMINATION; MULTIWALLED CARBON NANOTUBES (MWCN); NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SUBSTRATES;

AFM PROBES; AMPLITUDE JUMPS; AMPLITUDE RESPONSES; ATOMIC FORCE MICROSCOPES; ATOMIC FORCES; DIRECT OBSERVATIONS; NANOMANIPULATORS; SCANNING ELECTRON MICROSCOPES; STABLE OPERATIONS; SUBSTRATE SURFACES; TAPPING MODES; TILTING ANGLES; WORKING CONDITIONS;

CARBON NANOTUBES;

EID: 54849406275     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp804481g     Document Type: Article

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