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Volumn 80, Issue 12, 2002, Pages 2225-2227

Wafer scale production of carbon nanotube scanning probe tips for atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

NANO-SCALE IMAGING; NANOTUBE PROBES; PATTERNING TECHNIQUES; SCALE-UP; SCANNING PROBE LITHOGRAPHY; SCANNING PROBES; WAFER SCALE; WAFER SCALE FABRICATION;

EID: 79956011133     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1464227     Document Type: Article
Times cited : (132)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.