Tapping mode scanning force microscopy in water using a carbon nanotube probe

Ultramicroscopy

Volumn 80, Issue 4, 1999, Pages 237-246

  Moloni, Katerina ^a   Buss, Michael R ^a   Andres, Ronald P ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

AFM; Carbon nanotube; SPM; Tapping mode

Indexed keywords

ASPECT RATIO; CARBON; NANOTUBES; OPTICAL RESOLVING POWER; PROBES; SILICON;

CANTILEVERS; TAPPING MODE SCANNING FORCE MICROSCOPY (TMSFM); ULTRAMICROSCOPY;

MICROSCOPIC EXAMINATION;

CARBON; WATER;

ACOUSTIC IMPEDANCE; ARTICLE; HYDRODYNAMICS; IMAGING AND DISPLAY; MODEL; OPTICAL RESOLUTION; SCANNING FORCE MICROSCOPY; WATER IMMERSION;

EID: 0032752303     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00107-2     Document Type: Article

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