Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging

Nanotechnology

Volumn 19, Issue 23, 2008, Pages

  Zhao, Minhua ^a,b   Sharma, Vaneet ^a   Wei, Haoyan ^a   Birge, Robert R ^a   Stuart, Jeffrey A ^a   Papadimitrakopoulos, Fotios ^a   Huey, Bryan D ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b NATIONAL RESEARCH COUNCIL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ANALYSIS; ASPECT RATIO; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CARBON; CARBON NANOTUBES; DIMENSIONAL STABILITY; ELECTRONICS INDUSTRY; ELECTROPHORESIS; FLUID MECHANICS; INTEGRATED CIRCUITS; MICROELECTRONICS; MICROSCOPES; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; PHOTORESISTS; PRESSURE DROP; SCANNING; SCANNING PROBE MICROSCOPY; SURFACE POTENTIAL; SURFACE PROPERTIES; SURFACES;

(1 1 0) SURFACE; AMBIENT CONDITIONS; ATOMIC FORCE (AF); ATOMIC FORCE MICROSCOPY (AFM); BACTERIORHODOPSIN (BR); CIRCUIT STRUCTURES; DIELECTROPHORESIS (DEP); ELECTROSTATIC INTERACTIONS; ENHANCED SURFACES; HIGH ASPECT RATIO (HAR); HIGH RESOLUTIONS; LABEL FREE; LATERAL RESOLUTIONS; NANO TUBE; POTENTIAL IMAGING; PROBE SIZE; PROTEIN DETECTION; PURPLE MEMBRANE (PM); SCANNING SURFACE POTENTIAL MICROSCOPY (SSPM); SELF-ASSEMBLED;

IMAGING TECHNIQUES;

BACTERIORHODOPSIN; CARBON NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRICITY; ELECTROPHORESIS; IMAGING; PRIORITY JOURNAL; PROTEIN ANALYSIS; STRUCTURE ANALYSIS;

EID: 44949110034     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/23/235704     Document Type: Article

References (47)

1. Nonnenmacher M, Oboyle M P and Wickramasinghe H K 1991 Appl. Phys. Lett. 58 2921-3
2. Stern J E, Terris B D, Mamin H J and Rugar D 1988 Appl. Phys. Lett. 53 2717-9
3. Weaver J M R and Abraham D W 1991 J. Vac. Sci. Technol. B 9 1559-61
4. Kikukawa A, Hosaka S and Imura R 1996 Rev. Sci. Instrum. 67 1463-7
5. Jacobs H O, Knapp H F, Muller S and Stemmer A 1997 Ultramicroscopy 69 39-49
6. Nabhan W, Equer B, Broniatowski A and DeRosny G 1997 Rev. Sci. Instrum. 68 3108-11
7. Kitamura S, Suzuki K, Iwatsuki M and Mooney C B 2000 Appl. Surf. Sci. 157 222-7
8. Kitamura S and Iwatsuki M 1998 Appl. Phys. Lett. 72 3154-6
9. Jacobs H O, Knapp H F and Stemmer A 1999 Rev. Sci. Instrum. 70 1756-60
10. Yasutake M, Aoki D and Fujihira M 1996 Thin Solid Films 273 279-83
11. Yasutake M 1995 Japan. J. Appl. Phys. 1 34 3403-5
12. Fujihira M 1999 Annu. Rev. Mater. Sci. 29 353-80
13. Lu J, Delamarche E, Eng L, Bennewitz R, Meyer E and Guntherodt H J 1999 Langmuir 15 8184-8
14. Sugimura H, Saito N, Maeda N, Ikeda I, Ishida Y, Hayashi K, Hong L and Takai O 2004 Nanotechnology 15 S69-75
15. Schwarzman A, Grunbaum E, Strassburg E, Lepkifker E, Boag A, Rosenwaks Y, Glatzel T, Barkay Z, Mazzer M and Barnham K 2005 J. Appl. Phys. 98 4
16. Ono S and Takahashi T 2005 Japan. J. Appl. Phys. 1 44 6213-7
17. Chen L W, Ludeke R, Cui X D, Schrott A G, Kagan C R and Brus L E 2005 J. Phys. Chem. B 109 1834-8
18. Palermo V, Palma M and Samori P 2006 Adv. Mater. 18 145-64
19. Puntambekar K, Dong J P, Haugstad G and Frisbie C D 2006 Adv. Funct. Mater. 16 879-84
20. Chen S H 2007 Microsc. Res. Tech. 70 325-8
21. Seemann L, Stemmer A and Naujoks N 2007 Microelectron. Eng. 84 1423-6
22. Seemann L, Stemmer A and Naujoks N 2007 Nano Lett. 7 3007-12
23. Jacobs H O, Leuchtmann P, Homan O J and Stemmer A 1998 J. Appl. Phys. 84 1168-73
24. Ono S and Takahashi T 2004 Japan. J. Appl. Phys. 1 43 4639-42
25. Koley G, Spencer M G and Bhangale H R 2001 Appl. Phys. Lett. 79 545-7
26. Zerweck U, Loppacher C, Otto T, Grafstrom S and Eng L M 2005 Phys. Rev. B 71 9
27. Huey B D and Bonnell D A 2000 Solid State Ion. 131 51-60
28. Huey B D and Bonnell D A 2000 Appl. Phys. Lett. 76 1012-4
29. Huey B D, Lisjak D and Bonnell D A 1999 J. Am. Ceram. Soc. 82 1941-4
30. Glatzel T, Sadewasser S and Lux-Steiner M C 2003 Appl. Surf. Sci. 210 84-9
31. Gil A, Colchero J, Gomez-Herrero J and Baro A M 2003 Nanotechnology 14 332-40
32. Palacios-Lidon E and Colchero J 2006 Nanotechnology 17 5491-500
33. Zerweck U, Loppacher C, Otto T, Grafstrom S and Eng L M 2007 Nanotechnology 18 084006
34. Nakayama Y 2002 Ultramicroscopy 91 49-56
35. Nakayama Y and Akita S 2003 New J. Phys. 5 128.1-128.23
36. Takahashi S, Kishida T, Akita S and Nakayama Y 2001 Japan. J. Appl. Phys. 1 40 4314-6
37. Maeda C, Ozeki N, Kishimoto S, Mizutani T, Sugai T and Shinohara H 2002 Japan. J. Appl. Phys. 1 41 2615-9
38. Maeda C, Kishimoto S, Mizutani T, Sugai T and Shinohara H 2003 Japan. J. Appl. Phys. 1 42 2449-52
39. Wei H Y, Kim S N, Zhao M H, Ju S-Y, Huey B D, Marcus H L and Papadimitrakopoulos F 2008 Chem. Mater. 20 2793-801
40. Tang J, Yang G, Zhang Q, Parhat A, Maynor B, Liu J, Qin L C and Zhou O 2005 Nano Lett. 5 11-4
41. Sinensky A K and Belcher A M 2007 Nat. Nanotechnol. 2 653-9
42. Round A N and Miles M J 2004 Nanotechnology 15 S176-83
43. Hartley P, Matsumoto M and Mulvaney P 1998 Langmuir 14 5203-9
44. Knapp H F, Mesquida P and Stemmer A 2002 Surf. Interface Anal. 33 108-12
45. Lee I, Greenbaum E, Budy S, Hillebrecht J R, Birge R R and Stuart J A 2006 J. Phys. Chem. B 110 10982-90
46. Belaidi S, Girard P and Leveque G 1997 J. Appl. Phys. 81 1023-30
47. Hao H W, Baro A M and Saenz J J 1991 Electrostatic and contact forces in force microscopy Proc. of the 5th Int. Conf. Scanning Tunneling Microscopy/Spectroscopy (Baltimore, MD) (Baltimore, MD: AVS) pp 1323-8