Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: Experimental investigation

Nanotechnology

Volumn 17, Issue 12, 2006, Pages 2937-2941

  Kim, Ji Eun ^a   Park, June Ki ^b   Han, Chang Soo ^a  

^a Korea Institute of Machine and Materials   (South Korea)

^b Top Nanosys Incorporated   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; COATING TECHNIQUES; ELECTRIC FIELD EFFECTS; IMAGE PROCESSING; WEAR RESISTANCE;

ANODIZED ALUMINIUM OXIDE (AAO) STRUCTURE; DIELECTROPHORESIS (DEP); HIGH-RESOLUTION IMAGES;

ELECTROPHORESIS;

EID: 33746601188     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/12/019     Document Type: Article

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