Resolution enhancement in contact-type scanning nonlinear dielectric microscopy using a conductive carbon nanotube probe tip

Nanotechnology

Volumn 18, Issue 8, 2007, Pages

  Ishikawa, Kenya ^a   Honda, Koichiro ^b   Cho, Yasuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; FERROELECTRIC MATERIALS; LITHIUM COMPOUNDS; MAGNETIC DOMAINS; MICROSCOPIC EXAMINATION; MOSFET DEVICES;

FERROELECTRIC DOMAIN WALL; LITHIUM TANTALATE; SCANNING NONLINEAR DIELECTRIC MICROSCOPE (SNDM);

IMAGE RESOLUTION;

CARBON NANOTUBE; LITHIUM DERIVATIVE; METAL; PLATINUM;

CONFERENCE PAPER; MOLECULAR PROBE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; STOICHIOMETRY;

EID: 33947524348     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/8/084015     Document Type: Conference Paper

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