Electrostatic characteristics of nanostructures investigated using electric force microscopy

Journal of Solid State Chemistry

Volumn 181, Issue 7, 2008, Pages 1670-1677

  Qiu, X H ^a   Qi, G C ^a   Yang, Y L ^a   Wang, C ^a  

^a NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

Author keywords

Electric force microscopy; Electrostatic characteristics; Nanomaterials; Nanostructures

Indexed keywords

CHARGE DENSITY; CHEMICAL PROPERTIES; DIELECTRIC PROPERTIES; ELECTRIC PROPERTIES; FETAL MONITORING; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES;

ELECTRIC FORCE MICROSCOPY; ELECTRICAL CHARACTERISTICS; ELECTRICAL PROPERTIES; ELECTROSTATIC CHARACTERISTICS; NANO-SIZED MATERIALS; NANOMATERIALS; PHYSICAL AND CHEMICAL PROPERTIES; QUANTITATIVE MEASUREMENTS; RATIONAL DESIGN; RECENT PROGRESS;

MATERIALS PROPERTIES;

EID: 52649162901     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2008.06.036     Document Type: Article

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