메뉴 건너뛰기




Volumn 68, Issue 4, 2003, Pages

Detection of electrostatic forces with an atomic force microscope: Analytical and experimental dynamic force curves in the nonlinear regime

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTRICITY; HYSTERESIS; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; OSCILLATION; PHASE TRANSITION;

EID: 0041336846     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.045403     Document Type: Article
Times cited : (55)

References (28)
  • 22
    • 0031122070 scopus 로고    scopus 로고
    • phase is used to distinguish between surfaces of different stiffness
    • S. Magonov, V. Elings, and M. Whangbo, Surf. Sci. 375, L385 (1997), phase is used to distinguish between surfaces of different stiffness.
    • (1997) Surf. Sci , vol.375
    • Magonov, S.1    Elings, V.2    Whangbo, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.