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Volumn 188, Issue 3-4, 2002, Pages 399-402
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Surface potential analysis on doping superlattice by electrostatic force microscope
a
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Author keywords
Atomic force microscope (AFM); Doping superlattice; Electrostatic force microscope (EFM); Scanning probe microscope (SPM); Surface potential
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROSTATICS;
MOLECULAR BEAM EPITAXY;
NANOSTRUCTURED MATERIALS;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR QUANTUM WIRES;
SEMICONDUCTOR SUPERLATTICES;
ELECTROSTATIC FORCE MICROSCOPES (EFM);
SCANNING PROBE MICROSCOPES (SPM);
SURFACE MEASUREMENT;
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EID: 0037187227
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00957-6 Document Type: Conference Paper |
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Times cited : (6)
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References (8)
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