Photoinduced interfacial charging and "explosion" of monolayer Pentacene Islands

Nano Letters

Volumn 5, Issue 11, 2005, Pages 2241-2245

  Chen, Liwei ^a,b   Cherniavskaya, Oksana ^a   Shalek, Alexander ^a,c   Brus, Louis E ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b OHIO UNIVERSITY   (United States)

^c HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COULOMB REPULSION; INTERFACIAL CHARGING; NITROGEN ENVIRONMENT; PENTACENE;

COULOMB BLOCKADE; ELECTROSTATICS; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; NITROGEN; PHOTOCHEMICAL REACTIONS;

MONOLAYERS;

EID: 28144432898     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl051567m     Document Type: Article

References (23)

1. Forrest, S. R. Nature 2004, 428, 911-918.
2. Rogers, J. A.; Bao, Z.; Katz, H. E.; Dodabalapur, A. In Thin-Film Transistors; Marcel Dekker Inc.: New York, 2003; pp 377-425.
3. Dimitrakopoulos, C. D.; Malenfant, P. R. L. Adv. Mater. 2002, 14, 99-117.
4. Jackson, N.; Lin, Y. Y.; Gundlach, D. J.; Klauk, H. IEEE J. Quantum Electron. 1998, 4, 100-104.
5. Lin, Y. Y.; Gundlach, D. J.; Nelson, S. F.; Jackson, T. N. IEEE Electron Device Lett. 1997, 18, 606-608.
6. Lin, Y. Y.; Gundlach, D. J.; Nelson, S. F.; Jackson, T. N. IEEE Trans. Electron Devices 1997, 44, 1325-1331.
7. Horowitz, G.; Hajlaoui, R.; Bouchriha, H.; Bourguiga, R.; Hajlaoui, M. Adv. Mater. 1998, 10, 923-927.
8. Dinelli, F.; Murgia, M.; Levy, P.; Cavallini, M.; Biscarini, F.; de Leeuw, D. M. Phys. Rev. Lett. 2004, 92, 116802.
9. Ruiz, R.; Papadimitratos, A.; Mayer, A. C.; Malliaras, G. G. Adv. Mater. 2005, 17, 1795-1798.
10. Chua, L. L.; Zaumseil, J.; Chang, J. F.; Ou, E. C. W.; Ho, P. K. H.; Sirringhaus, H.; Friend, R. H. Nature 2005, 434, 194-199.
11. Yagi, I.; Tsukagoshi, K.; Aoyagi, Y. Appl. Phys. Lett. 2005, 86, 103502.
12. Muller, E. M.; Marohn, J. A. Adv. Mater. 2005, 17, 1410-1414.
13. Heim, T.; Lmimouni, K.; Vuillaume, D. Nano Lett. 2004, 4, 2145-2150.
14. Chen, L. W.; Ludeke, R.; Cui, X. D.; Schrott, A.; Kagan, C. R.; Brus, L. E. J. Phys. Chem. B 2005, 109, 1834-1838.
15. Cherniavskaya, O.; Chen, L. W.; Weng, V.; Yuditsky, L.; Brus, L. E. J. Phys. Chem. B 2003, 107, 1525-1531.
16. Hutter, J. L.; Bechhoefer, J. Rev. Sci. Instrum. 1993, 64, 1868-1873.
17. Cui, X. D.; Freitag, M.; Martel, R.; Brus, L.; Avouris, P. Nano Lett. 2003, 3, 783-787.
18. Ludeke, R.; Cartier, E. Microelectron. Eng. 2001, 59, 259-263.
19. Ludeke, R.; Cartier, E. Appl. Phys. Lett. 2001, 78, 3998-4000.
20. Ben-Porat, C. H.; Cherniavskaya, O.; Brus, L.; Cho, K. S.; Murray, C. B. J. Phys. Chem. A 2004, 708, 7814-7819.
21. Cherniavskaya, O.; Chen, L. W.; Brus, L. J. Phys. Chem. B 2004, 108, 4946-4961.
22. Cherniavskaya, O.; Chen, L. W.; Islam, M. A.; Brus, L. Nano Lett. 2003, 5, 497-501.
23. Dekruif, C. G. J. Chem. Thermodyn. 1980, 12, 243-248.