Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy

Applied Physics Letters

Volumn 86, Issue 21, 2005, Pages 1-3

  Zdrojek, M ^a,b   Melin T ^a   Boyaval, C ^a   Stievenard D ^a   Jouault, B ^c   Wozniak, M ^b   Huczko, A ^d   Gebicki, W ^b   Adamowicz, L ^b  

^a INSTITUT D ELECTRONIQUE   (France)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c UNIVERSITÉ MONTPELLIER 2   (France)

^d UNIVERSITY OF WARSAW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CONDUCTIVITY; ELECTRON EMISSION; ELECTROSTATICS; MICROSCOPIC EXAMINATION; SILICON WAFERS;

CHARGE INJECTION; CHARGE SENSITIVE PLATES; ELECTRIC FORCE MICROSCOPY (EFM); ELECTROSTATIC PROPERTIES;

CARBON NANOTUBES;

EID: 20844458385     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1925782     Document Type: Article

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