Scanned Conductance Microscopy of Carbon Nanotubes and λ-DNA

Nano Letters

Volumn 2, Issue 3, 2002, Pages 187-190

  Bockrath, Marc ^a   Markovic, Nina ^a   Shepard, Adam ^a   Tinkham, M ^a   Gurevich, Leonid ^b   Kouwenhoven, Leo P ^b   Wu, Mingshaw W ^c   Sohn, L L ^c  

^a HARVARD UNIVERSITY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c PRINCETON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000988849     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0100724     Document Type: Article

References (18)

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16. 0. This, however, should not change our basic conclusions.
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18. Occasionally, we find nanotubes that produce a noticeably smaller phase shift in the SC image than other nanotubes on the same wafer of similar length. We speculate that these tubes are highly resistive due to the presence of defects, or possibly that they are especially resistive semiconducting nanotubes. More experiments are necessary to clarify this issue.