Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy

Applied Physics Letters

Volumn 85, Issue 13, 2004, Pages 2538-2540

  Bussmann, E ^a   Kim, Dong Jun ^a   Williams, C C ^a  

^a UNIVERSITY OF UTAH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPY (EFM); FREQUENCY DETECTION; SINGLE ELECTRON TUNNELING; SURFACE CHARGES;

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC POTENTIAL; ELECTRON TUNNELING; ELECTROSTATICS; FREQUENCY MODULATION; IONIZATION; NATURAL FREQUENCIES; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; VACUUM;

ELECTRIC INSULATORS;

EID: 7544248442     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1795979     Document Type: Article

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