Induced nanoscale deformations in polymers using atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 17, 2004, Pages 1-8

  Lyuksyutov, Sergei F ^a   Paramonov, Pavel B ^a   Sharipov, Ruslan A ^b   Sigalov, Grigori ^c  

^a UNIVERSITY OF AKRON   (United States)

^b Birsk Branch of Federal State Budgetary Educational Establishment of Higher Education Bashkir State University   (Russian Federation)

^c VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; ELECTRIC FIELD; EXPERIMENTATION; MATHEMATICAL ANALYSIS; PLASTICITY;

EID: 12344275515     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.174110     Document Type: Article

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