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Volumn 79, Issue 6, 2001, Pages 791-793

Localized charge injection in SiO2 films containing silicon nanocrystals

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040374473     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1383574     Document Type: Article
Times cited : (58)

References (18)
  • 13
    • 0039809758 scopus 로고    scopus 로고
    • From Transene Co. Inc.: 7.2% hydrofluoric acid, 36% ammonium fluoride, balance distilled water
    • From Transene Co. Inc.: 7.2% hydrofluoric acid, 36% ammonium fluoride, balance distilled water.
  • 15
    • 0040402255 scopus 로고    scopus 로고
    • Thermomicroscopes (formally Park Scientific), 1171 Borregas Avenue, Sunnyvale, CA 94089
    • Thermomicroscopes (formally Park Scientific), 1171 Borregas Avenue, Sunnyvale, CA 94089.
  • 18
    • 0043116551 scopus 로고
    • Amsterdam
    • H. C. Hamaker, Physica (Amsterdam) 4, 1058 (1937).
    • (1937) Physica , vol.4 , pp. 1058
    • Hamaker, H.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.