Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy

Physical Review Letters

Volumn 94, Issue 5, 2005, Pages

  Stomp, Romain ^a   Miyahara, Yoichi ^a   Schaer, Sacha ^a   Sun, Qingfeng ^a   Guo, Hong ^a   Grutter, Peter ^a   Studenikin, Sergei ^b   Poole, Philip ^b   Sachrajda, Andy ^b  

^a MCGILL UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

MICROMECHANICAL OSCILLATORS; NONCONTACT ATOMIC-FORCE MICROSCOPY; SELF-ASSEMBLED SEMICONDUCTOR QUANTUM DOTS (SAQD); SINGLE-ELECTRON CHARGING;

ATOMIC FORCE MICROSCOPY; COULOMB BLOCKADE; ELECTRODES; FREE ENERGY; NATURAL FREQUENCIES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 18144384191     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.056802     Document Type: Article

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